Biography:

John A. Rodriguez was born in San Antonio, TX. He received the Ph.D. in electrical and computer engineering from Rice University in Houston, TX. Dr. Rodriguez is currently a Distinguished Member of the Technical Staff in Analog Technology Development at Texas Instruments in Dallas, where he researches the reliability physics of ferroelectric memory devices in advanced process technology. He is a member of the American Physics Society, American Ceramic Society and the IEEE. He has published or presented more than 40 papers in conferences and journals and has been awarded 21 US patents. Dr. Rodriguez is a recipient of the 2002 IEEE Reliability Physics Symposium Outstanding Paper Award, the 2005 Electrical Over-Stress/Electrostatic Discharge Symposium Best Presentation Award and the 2012 Semiconductor Research Corporation Mahboob Khan Outstanding Industry Liaison Award for his mentorship of a research program at the University of Florida. He received the prestigious Texas Instruments “Innovators in Action” Award in 2013 for his contributions to novel ultra-low-power integrated circuits.